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Stein, B. L. and Yu, E. T. and Croke, E. T. et al. (1998) Deep-level transient spectroscopy of Si/Si1–x–yGexCy heterostructures. Applied Physics Letters, 73 (5). pp. 647-649. ISSN 0003-6951. doi:10.1063/1.121935. https://resolver.caltech.edu/CaltechAUTHORS:STEapl98

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