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Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. I. Journal of Applied Physics, 14 (1). pp. 8-18. ISSN 0021-8979. doi:10.1063/1.1714924. https://resolver.caltech.edu/CaltechAUTHORS:BACjap43a

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