A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Daniel, E. S. and Jones, J. T. and Marsh, O. J. et al. (1997) Macroscopic and microscopic studies of electrical properties of very thin silicon dioxide subject to electrical stress. Journal of Vacuum Science and Technology B, 15 (4). pp. 1089-1096. ISSN 1071-1023. https://resolver.caltech.edu/CaltechAUTHORS:DANjvstb97

This list was generated on Thu Oct 17 02:20:30 2019 PDT.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.