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Daniel, E. S. and Jones, J. T. and Marsh, O. J. et al. (1997) Macroscopic and microscopic studies of electrical properties of very thin silicon dioxide subject to electrical stress. Journal of Vacuum Science and Technology B, 15 (4). pp. 1089-1096. ISSN 1071-1023. doi:10.1116/1.589419. https://resolver.caltech.edu/CaltechAUTHORS:DANjvstb97

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