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Gasser, S. M. and Ruiz, R. and Kolawa, E. et al. (1999) Instability of Amorphous Ru-Si-O Thin Films under Thermal Oxidation. Journal of the Electrochemical Society, 146 (4). pp. 1546-1548. ISSN 0013-4651.

This list was generated on Thu Oct 22 06:33:53 2020 PDT.