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O'Connor, S. D. and Gamble, R. C. and Eby, R. K. et al. (1996) Noise reduction in atomic force microscopy: Resonance contact mode. Review of Scientific Instruments, 67 (2). pp. 393-396. ISSN 0034-6748. doi:10.1063/1.1146602. https://resolver.caltech.edu/CaltechAUTHORS:OCOrsi96

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