A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Adams, P. M. and Bowman, R. C., Jr. and Ahn, C. C. et al. (1992) Structural characterization of Si(m)Ge(n) strained layer superlattices. Journal of Applied Physics, 71 (9). pp. 4305-4313. ISSN 0021-8979. https://resolver.caltech.edu/CaltechAUTHORS:ADAjap92

This list was generated on Sun Jan 19 02:39:13 2020 PST.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.