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Adams, P. M. and Bowman, R. C., Jr. and Ahn, C. C. et al. (1992) Structural characterization of Si(m)Ge(n) strained layer superlattices. Journal of Applied Physics, 71 (9). pp. 4305-4313. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:ADAjap92

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