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Kim, Il-Doo and Avrahami, Ytshak and Tuller, Harry L. et al. (2005) Study of orientation effect on nanoscale polarization in BaTiO3 thin films using piezoresponse force microscopy. Applied Physics Letters, 86 (19). Art. No. 192907. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:KIMapl05

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