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Kalantar, D. H. and Chandler, E. A. and Colvin, J. D. et al. (1999) Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser. Review of Scientific Instruments, 70 (1). pp. 629-632. ISSN 0034-6748. http://resolver.caltech.edu/CaltechAUTHORS:KALrsi99

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