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Lie, D. Y. C. and Vantomme, A. and Eisen, F. et al. (1993) Damage and strain in epitaxial GexSi1–x films irradiated with Si. Journal of Applied Physics, 74 (10). pp. 6039-6045. ISSN 0021-8979. doi:10.1063/1.355219.

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