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Lie, D. Y. C. and Vantomme, A. and Eisen, F. et al. (1993) Damage and strain in epitaxial GexSi1–x films irradiated with Si. Journal of Applied Physics, 74 (10). pp. 6039-6045. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:LIEjap93

This list was generated on Thu Nov 23 17:52:34 2017 PST.