A Caltech Library Service

Browse by Eprint ID

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 1.

Hwang, Gyeong S. and Giapis, Konstantinos P. (1997) The influence of mask thickness on charging damage during overetching. Journal of Applied Physics, 82 (2). pp. 572-577. ISSN 0021-8979.

This list was generated on Sun Oct 17 14:45:23 2021 UTC.