A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Hwang, Gyeong S. and Giapis, Konstantinos P. (1997) The influence of mask thickness on charging damage during overetching. Journal of Applied Physics, 82 (2). pp. 572-577. ISSN 0021-8979. https://resolver.caltech.edu/CaltechAUTHORS:HWAjap97a

This list was generated on Sat Jul 4 08:51:25 2020 PDT.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.