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Chen, I-Chen and Chen, Li-Han and Ye, Xiang-Rong et al. (2006) Extremely sharp carbon nanocone probes for atomic force microscopy imaging. Applied Physics Letters, 88 (15). Art. No. 153102. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:CHEapl06b

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