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Maby, E. W. and Atwater, H. A. and Keigler, A. L. et al. (1983) Electron-beam-induced current measurements in silicon-on-insulator films prepared by zone-melting recrystallization. Applied Physics Letters, 43 (5). pp. 482-484. ISSN 0003-6951. doi:10.1063/1.94359.

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