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Tandon, J. L. and Madok, J. H. and Leybovich, I. S. et al. (1989) Sequential nature of damage annealing and activation in implanted GaAs. Applied Physics Letters, 54 (5). pp. 448-450. ISSN 0003-6951. doi:10.1063/1.100948. https://resolver.caltech.edu/CaltechAUTHORS:TANapl89.965

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