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Stein, B. L. and Yu, E. T. and Croke, E. T. et al. (1997) Measurement of band offsets in Si/Si1–xGex and Si/Si1–x–yGexCy heterojunctions. Journal of Vacuum Science and Technology B, 15 (4). pp. 1108-1111. ISSN 1071-1023. doi:10.1116/1.589422. https://resolver.caltech.edu/CaltechAUTHORS:STEjvstb97

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