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Johnson, R. W. and Johnson, W. L. (1988) X-ray diffractometer stage for in situ structural analysis of thin films. Review of Scientific Instruments, 59 (12). pp. 2568-2572. ISSN 0034-6748. doi:10.1063/1.1139899. https://resolver.caltech.edu/CaltechAUTHORS:JOHrsi88

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