A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Johnson, R. W. and Johnson, W. L. (1988) X-ray diffractometer stage for in situ structural analysis of thin films. Review of Scientific Instruments, 59 (12). pp. 2568-2572. ISSN 0034-6748. https://resolver.caltech.edu/CaltechAUTHORS:JOHrsi88

This list was generated on Sun Oct 25 03:23:40 2020 PDT.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.