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Masuhr, A. and Bracht, H. and Stolwijk, N. A. et al. (1999) Point defects in silicon after zinc diffusion - a deep level transient spectroscopy and spreading-resistance profiling study. Semiconductor Science and Technology, 14 (5). pp. 435-440. ISSN 0268-1242. doi:10.1088/0268-1242/14/5/011.

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