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Hammel, P. Chris and Pelekhov, Denis V. and Wigen, Philip E. et al. (2003) The magnetic-resonance force microscope: a new tool for high-resolution, 3-D, subsurface scanned probe imaging. Proceedings of the IEEE, 91 (5). pp. 789-798. ISSN 0018-9219. http://resolver.caltech.edu/CaltechAUTHORS:HAMprocieee03

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