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Number of items: 1. Scherer, A. and Craighead, H. G. and Roukes, M. L. et al. (1988) Electrical damage induced by ion beam etching of GaAs. Journal of Vacuum Science and Technology B, 6 (1). pp. 277-279. ISSN 1071-1023. https://resolver.caltech.edu/CaltechAUTHORS:SCHEjvstb88 |