A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Scherer, A. and Craighead, H. G. and Roukes, M. L. et al. (1988) Electrical damage induced by ion beam etching of GaAs. Journal of Vacuum Science and Technology B, 6 (1). pp. 277-279. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:SCHEjvstb88

This list was generated on Thu Jul 18 09:34:07 2019 PDT.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.