A Caltech Library Service

Browse by Eprint ID

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Number of items: 1.

Ting, D. Z.-Y. and Daniel, Erik S. and McGill, T. C. (1998) Interface Roughness Effects in Ultra-Thin Tunneling Oxides. VLSI Design, 8 (1-4). pp. 47-51. ISSN 1065-514X. doi:10.1155/1998/23567.

This list was generated on Fri Dec 9 17:16:12 2022 UTC.