A Caltech Library Service

Browse by Eprint ID

Number of items: 1.

Ting, D. Z.-Y. and Daniel, Erik S. and McGill, T. C. (1998) Interface Roughness Effects in Ultra-Thin Tunneling Oxides. VLSI Design, 8 (1-4). pp. 47-51. ISSN 1065-514X. https://resolver.caltech.edu/CaltechAUTHORS:TINvd98b

This list was generated on Fri Feb 26 08:31:44 2021 PST.

CaltechAUTHORS is powered by EPrints 3.3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.