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Baum, Peter and Zewail, Ahmed H. (2006) Breaking resolution limits in ultrafast electron diffraction and microscopy. Proceedings of the National Academy of Sciences of the United States of America, 103 (44). pp. 16105-16110. ISSN 0027-8424. PMCID PMC1637544. http://resolver.caltech.edu/CaltechAUTHORS:BAUpnas06

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