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Hasler, Paul and Andreou, Andreas G. and Diorio, Chris et al. (1998) Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport. VLSI Design, 8 (1-4). pp. 455-461. ISSN 0279-2834. doi:10.1155/1998/73698. https://resolver.caltech.edu/CaltechAUTHORS:HASvd98

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