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Items where Person is "Dommann-A"

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Jump to: 2019 | 1998 | 1991 | 1988 | 1987
Number of items: 6.

2019

Mohr, Markus and Wunderlich, Rainer K. and Zweiacker, Kai et al. (2019) Surface tension and viscosity of liquid Pd_(43)Cu_(27)Ni_(10)P_(20) measured in a levitation device under microgravity. npj Microgravity, 5 . Art. No. 4. ISSN 2373-8065. http://resolver.caltech.edu/CaltechAUTHORS:20190328-165908542

1998

Grétillat, M.-A. and Linder, C. and Dommann, A. et al. (1998) Surface-micromachined Ta–Si–N beams for use in micromechanics. Journal of Micromechanics and Microengineering, 8 (2). pp. 88-90. ISSN 0960-1317. http://resolver.caltech.edu/CaltechAUTHORS:GREjmm98

Grétillat, M.-A. and Linder, C. and Dommann, A. et al. (1998) Surface-micromachined Ta-Si-N beams for use in micromechanics. Journal of Micromechanics and Microengineering, 8 (2). pp. 88-90. ISSN 0960-1317. http://resolver.caltech.edu/CaltechAUTHORS:20111222-090724822

1991

Tsai, C. J. and Dommann, A. and Nicolet, M. A. et al. (1991) Self-consistent determination of the perpendicular strain profile of implanted Si by analysis of x-ray rocking curves. Journal of Applied Physics, 69 (4). pp. 2076-2079. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:TSAjap91

1988

Vreeland, T., Jr. and Dommann, A. and Tsai, C.-J. et al. (1988) X-Ray Diffraction Determination of Stresses in Thin Films. In: Thin films: Stresses and Mechanical Properties. Materials Research Society Symposia Proceedings. No.130. Materials Research Society , Pittsburgh, PA, pp. 3-12. ISBN 9781558990036. http://resolver.caltech.edu/CaltechAUTHORS:20150123-145143727

1987

Bai, G. and Tsai, C.-J. and Dommann, A. et al. (1987) Characterization of Semiconductors by MeV He+ Backscattering Spectrometry, Channeling and Double Crystal Diffraction. . (Unpublished) http://resolver.caltech.edu/CaltechAUTHORS:20150312-080542685

This list was generated on Thu Jun 20 09:32:44 2019 PDT.