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Items where Person is "Friedrich-C-R"

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Chasiotis, Ioannis and Knauss, Wolfgang G. (1998) Mechanical properties of thin polysilicon films by means of probe microscopy. In: Materials and Device Characterization in Micromachining. Proceedings of SPIE. No.3512. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 66-75. ISBN 9780819429711.

This list was generated on Wed Apr 8 06:22:26 2020 PDT.