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Items where Person is "Gibson-J-M"

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Number of items: 5.

H

Hamdi, A. H. and Tandon, J. L. and Vreeland, T., Jr. et al. (1984) Strain and Damage Measurements in Ion Implanted Al_xGa_(1−x)As/GaAs Superlattices. In: Layered structures, epitaxy, and interfaces. Materials Research Society symposia proceedings. No.37. Materials Research Society , Pittsburgh, PA, pp. 319-325. ISBN 9780931837029. https://resolver.caltech.edu/CaltechAUTHORS:20150206-151636897

P

Paine, B. M. and Vreeland, T., Jr. and Cheung, J. T. (1986) Structural Characterization of HgTe/Cd/Te Superlattices. In: Layered Structures and Epitaxy. Materials Research Society Symposia Proceedings. No.56. Materials Research Society , Pittsburgh, PA, pp. 313-319. ISBN 9780931837210. https://resolver.caltech.edu/CaltechAUTHORS:20150210-085506576

S

Smith, Aimée L. and Yu, Qiuming and Elliot, S. T. et al. (1996) Modification of the surface band-bending of a silicon CCD for low-energy electron detection. In: Control of Semiconductor Surfaces and Interfaces. Materials Research Society Conference Proceedings. No.448. Materials Research Society , Cambridge, MA, pp. 177-183. ISBN 1-55899-352-5. https://resolver.caltech.edu/CaltechAUTHORS:20141028-133726362

Scherer, A. and Van der Gaag, B. P. (1990) Ion etching of ultranarrow structures. In: Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors. Proceedings of SPIE. No.1284. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 149-160. ISBN 0819403350. https://resolver.caltech.edu/CaltechAUTHORS:20180709-091321458

V

Van der Gaag, B. P. and Scherer, A. and Schiavone, L. M. (1990) Microfabrication below 10 nm. In: Nanostructure and Microstructure Correlation with Physical Properties of Semiconductors. Proceedings of SPIE. No.1284. Society of Photo-optical Instrumentation Engineers (SPIE) , Bellingham, WA, pp. 161-169. ISBN 9780819403353. https://resolver.caltech.edu/CaltechAUTHORS:20180706-165009074

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