Items where Person is "Jayadev-T-S"

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Vreeland, Thad, Jr. and Jayadev, T. S. (1986) Strain and Damage in Silicon Due to a Deep Oxygen Implantation. In: Semiconductor-on-Insulator and Thin Film Transistor Technology. Materials Research Society Symposia Proceedings. No.53. Materials Research Society , Pittsburgh, PA, pp. 263-268. ISBN 9780931837180. https://resolver.caltech.edu/CaltechAUTHORS:20150126-123524683

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