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2017

Nellist, Michael R. and Chen, Yikai and Mark, Andreas et al. (2017) Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging. Nanotechnology, 28 (9). Art. No. 095711. ISSN 0957-4484. http://resolver.caltech.edu/CaltechAUTHORS:20170131-095024118

This list was generated on Wed Sep 18 06:37:29 2019 PDT.