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Items where Person is "Mehrer-H"

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Masuhr, A. and Bracht, H. and Stolwijk, N. A. et al. (1999) Point defects in silicon after zinc diffusion - a deep level transient spectroscopy and spreading-resistance profiling study. Semiconductor Science and Technology, 14 (5). pp. 435-440. ISSN 0268-1242.

This list was generated on Tue Sep 17 13:06:08 2019 PDT.