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Items where Person is "Mehrer-H"

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Jump to: 1999
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1999

Masuhr, A. and Bracht, H. and Stolwijk, N. A. et al. (1999) Point defects in silicon after zinc diffusion - a deep level transient spectroscopy and spreading-resistance profiling study. Semiconductor Science and Technology, 14 (5). pp. 435-440. ISSN 0268-1242. http://resolver.caltech.edu/CaltechAUTHORS:MASsst99

This list was generated on Fri May 24 00:10:23 2019 PDT.