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Items where Person is "Nix-W-D"

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Jump to: 2008 | 2007 | 2006 | 2005 | 2003 | 1988
Number of items: 8.

2008

Budiman, A. S. and Han, S. M. and Greer, J. R. et al. (2008) A search for evidence of strain gradient hardening in Au submicron pillars under uniaxial compression using synchrotron X-ray microdiffraction. Acta Metallurgica et Materialia, 56 (3). pp. 602-608. ISSN 0956-7151. https://resolver.caltech.edu/CaltechAUTHORS:20170408-144528730

2007

Nix, William D. and Greer, Julia R. and Feng, Gang et al. (2007) Deformation at the nanometer and micrometer length scales: Effects of strain gradients and dislocation starvation. Thin Solid Films, 515 (6). pp. 3152-3157. ISSN 0040-6090. https://resolver.caltech.edu/CaltechAUTHORS:20130710-153043195

2006

Wang, Junlan and Lian, Jie and Greer, Julia R. et al. (2006) Size effect in contact compression of nano- and microscale pyramid structures. Acta Materialia, 54 (15). pp. 3973-3982. ISSN 1359-6454. https://resolver.caltech.edu/CaltechAUTHORS:20130710-151346908

Greer, Julia R. and Nix, William D. (2006) Nanoscale gold pillars strengthened through dislocation starvation. Physical Review B, 73 (24). Art. No. 245410. ISSN 1098-0121. https://resolver.caltech.edu/CaltechAUTHORS:GREprb06

2005

Greer, J. R. and Nix, W. D. (2005) Size dependence of mechanical properties of gold at the sub-micron scale. Applied Physics A: Materials Science and Processing, 80 (8). pp. 1625-1629. ISSN 0947-8396. https://resolver.caltech.edu/CaltechAUTHORS:20130710-144814692

Greer, Julia R. and Oliver, Warren C. and Nix, William D. (2005) Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients. Acta Materialia, 53 (6). pp. 1821-1830. ISSN 1359-6454. https://resolver.caltech.edu/CaltechAUTHORS:20130710-145408467

2003

Conner, R. D. and Johnson, W. L. and Paton, N. E. et al. (2003) Shear bands and cracking of metallic glass plates in bending. Journal of Applied Physics, 94 (2). pp. 904-911. ISSN 0021-8979. https://resolver.caltech.edu/CaltechAUTHORS:CONjap03

1988

Vreeland, T., Jr. and Dommann, A. and Tsai, C.-J. et al. (1988) X-Ray Diffraction Determination of Stresses in Thin Films. In: Thin films: Stresses and Mechanical Properties. Materials Research Society Symposia Proceedings. No.130. Materials Research Society , Pittsburgh, PA, pp. 3-12. ISBN 9781558990036. https://resolver.caltech.edu/CaltechAUTHORS:20150123-145143727

This list was generated on Sat Aug 8 03:52:31 2020 PDT.