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Items where Person is "Ohler-M"

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2000

Christensen, Finn E. and Craig, William W. and Hailey, Charles J. et al. (2000) Hard x-ray characterization of a HEFT single-reflection prototype. In: X-Ray Optics, Instruments, and Missions III. Proceedings of SPIE. No.4012. Society of Photo-Optical Instrumentation Engineers , Bellingham, WA, pp. 626-638. ISBN 9780819436375. https://resolver.caltech.edu/CaltechAUTHORS:20180110-155844989

This list was generated on Wed Apr 1 01:33:45 2020 PDT.