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Items where Person is "Schowalter-L-J"

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Hauenstein, R. J. and Schlesinger, T. E. and McGill, T. C. et al. (1986) Schottky barrier height measurements of type-A and type-B NiSi2 epilayers on Si. Journal of Vacuum Science and Technology A, 4 (3). pp. 860-864. ISSN 0734-2101. http://resolver.caltech.edu/CaltechAUTHORS:HAUjvsta86

Hauenstein, R. J. and Schlesinger, T. E. and McGill, T. C. et al. (1986) Summary Abstract: Schottky barrier height measurements of type A and type B NiSi2 on Si. Journal of Vacuum Science and Technology B, 4 (2). pp. 549-550. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:HAUjvstb86

This list was generated on Sun Sep 22 08:18:07 2019 PDT.