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Items where Person is "Sugiyama-Naoyuki"

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Jump to: 2017
Number of items: 2.

2017

Matsuhata, Hirofumi and Sugiyama, Naoyuki and Chen, Bin et al. (2017) Surface defects generated by extrinsic origins on 4H-SiC epitaxial-wafers observed by scanning electron microscopy. Microscopy, 66 (2). pp. 103-109. ISSN 2050-5698. http://resolver.caltech.edu/CaltechAUTHORS:20170428-080249226

Matsuhata, Hirofumi and Sugiyama, Naoyuki and Chen, Bin et al. (2017) Surface defects generated by intrinsic origins on 4H-SiC epitaxial wafers observed by scanning electron microscopy. Microscopy, 66 (2). pp. 95-102. ISSN 2050-5698. http://resolver.caltech.edu/CaltechAUTHORS:20170428-081423591

This list was generated on Thu Jun 20 09:34:25 2019 PDT.