Published May 2017
| public
Book Section - Chapter
Lensfree On-chip Microscopy Achieves Accurate Measurement of Yeast Cell Viability and Concentration Using Machine Learning
Abstract
Automatic measurement of yeast viability and concentration is achieved by coupling a lensfree on-chip holographic microscope with a machine learning based classification algorithm that counts the number of live/dead cells stained with methylene blue.
Additional Information
© 2017 IEEE.Additional details
- Eprint ID
- 85989
- DOI
- 10.1364/CLEO_AT.2017.ATh4B.4
- Resolver ID
- CaltechAUTHORS:20180420-125357838
- Created
-
2018-04-25Created from EPrint's datestamp field
- Updated
-
2021-11-15Created from EPrint's last_modified field