CaltechAUTHORS
Published May 10, 2004 | Version public
Journal Article Metadata-only

Ultrafast Electron Crystallography of Surface Structural Dynamics with Atomic-Scale Resolution

Creators

Abstract

A formidable contender to X-ray diffraction is ultrafast electron crystallography. Whereas the former is more suited to investigate the bulk of the substrate, the time, length, and sensitivity scales of electron crystallography provide powerful and complementary information on atomic-scale structural dynamics at the surface (see diffraction image of GaAs crystal).

Additional Information

© 2004 Wiley-VCH Verlag GmbH & Co. Received: February 10, 2004. Published Online: March 23, 2004. This work was supported by the National Science Foundation. Some support was also provided by the Air Force Office of Scientific Research. F.V. acknowledges partial financial support from the Swiss National Science Foundation and S.C. a Millikan fellowship at Caltech. We thank Professor N. Lewis and L. Webb for functionalizing the silicon surface.

Additional details

Identifiers

Eprint ID
69696
DOI
10.1002/anie.200453983
Resolver ID
CaltechAUTHORS:20160817-092916920

Related works

Describes
10.1002/anie.200453983 (DOI)

Funding

NSF
Air Force Office of Scientific Research (AFOSR)
Swiss National Science Foundation (SNSF)
Robert A. Millikan Fellowship

Dates

Created
2016-08-17
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Updated
2021-11-11
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