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Published January 2005 | public
Journal Article

Composite Nanowire-Based Probes for Magnetic Resonance Force Microscopy


We present a nanowire-based methodology for the fabrication of ultrahigh sensitivity and resolution probes for atomic resolution magnetic resonance force microscopy (MRFM). The fabrication technique combines electrochemical deposition of multifunctional metals into nanoporous polycarbonate membranes and chemically selective electroless deposition of optical nanoreflector onto the nanowire. The completed composite nanowire structure contains all the required elements for an ultrahigh sensitivity and resolution MRFM sensor with (a) a magnetic nanowire segment providing atomic resolution magnetic field imaging gradients as well as large force gradients for high sensitivity, (b) a noble metal enhanced nanowire segment providing efficient scattering cross-section from a sub-wavelength source for optical readout of nanowire vibration, and (c) a nonmagnetic/nonplasmonic nanowire segment providing the cantilever structure for mechanical detection of magnetic resonance.

Additional Information

© 2005 American Chemical Society. Received 1 October 2004. Published online 13 November 2004. Published in print 1 January 2005. This work was supported by the Caltech Grubstake Fund and by the NSF-CAREER award (DMR-0349319). The authors thank Dr. Joyce Wong for helpful suggestions and careful reading of the manuscript.

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