Published August 26, 2003
| Published
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Preferred Position of the Detector for MeV Backscattering Spectrometry
- Creators
- Eisen, F. H.
- Nicolet, M.-A.
- Others:
- Duggan, Jerome L.
- Morgan, I. L.
Abstract
When an amorphous target is tilted with respect to the incident beam, the yield of an MeV backscattering spectrum will not change height if the measurements are executed under suitable conditions. One of these involves the position of the detector with respect to the plane defined by the directions of the incident beam and the tilt axis, as demonstrated here. The results clarify early data on the subject.
Additional Information
© 2003 American Institute of Physics. Issue Date: 26 August 2003.Attached Files
Published - EISaipcp03.pdf
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Additional details
- Eprint ID
- 27152
- Resolver ID
- CaltechAUTHORS:20111011-081811288
- Created
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2011-10-11Created from EPrint's datestamp field
- Updated
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2021-11-09Created from EPrint's last_modified field
- Series Name
- AIP Conference Proceedings
- Series Volume or Issue Number
- 680