Computer Enhancement of High Resolution Electron Micrographs Containing Weak Periodic Information
Using image processing methods and Fourier synthesis techniques similar to those mentioned by Nathan (1970), it has been possible to enhance weak periodic information contained in electron micrographs obtained from what might be characterized as less than ideal thin films. This paper describes the results of such an experiment and illustrates the potential afforded by these computer techniques in an ultrastructural analysis of similar type objects.
Additional InformationThis investigation was sponsored by the U.S. Atomic Energy Commission and the California Institute of Technology. The authors acknowledge valuable discussions with Dr. R. Nathan, Jet Propulsion Laboratories, California Institute of Technology, Pasadena, California. CALT-767-P3-26.