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Published June 10, 2013 | Supplemental Material
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High-Throughput Measurement of Ionic Conductivity in Composition-Spread Thin Films


This paper demonstrates the feasibility of high-throughput investigation of ionic conductivity in oxygen-ion conductors. Yttria stabilized zirconia (YSZ) composition-spread thin films with nanometer-size grains were prepared by 90° off-axis reactive RF cosputtering. We compare results for two electrode configurations, namely, out-of-plane (parallel plate) and in-plane (planar interdigitated electrode) and find that the contribution from the intragrain conductivity in YSZ thin films (150 nm) is more explicit in the latter configuration because it greatly diminishes electrode effects. The intragrain oxygen ion conductivity of thin film YSZ was systematically measured as a function of yttria concentration over the range 2 mol % to 12 mol %. The results show that the measured conductivity of the YSZ thin films is close to that of corresponding bulk materials with a peak value around 3 × 10⁻⁴ S cm⁻¹ at 440 °C at the optimum Y₂O₃ concentration of 8 mol %. Validation of this technique means that it can be applied to novel chemical systems for which systematic bulk measurements have not been attempted.

Additional Information

© 2013 American Chemical Society. Received: June 19, 2012; Published: May 5, 2013. This work utilized XRD and TEM facilities of the Cornell Center for Materials Research (NSF Funding: DMR-0520404), and was performed in part at the Cornell NanoScale Facility, a member of the National Nanotechnology Infrastructure Network, which is supported by the National Science Foundation (Grant ECS-0335765). This research was supported by the U.S. Department of Energy (DOE) Office of Basic Energy Sciences under Award Number DE-FG02–07ER46440. The authors declare no competing financial interest.

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