Photon-Induced Near Field Electron Microscopy
- Creators
- Park, Sang Tae
- Zewail, Ahmed H.
- Other:
- Liu, Zhiwen
Abstract
Ultrafast electron microscopy in the space and time domains utilizes a pulsed electron probe to directly map structural dynamics of nanomaterials initiated by an optical pump pulse, in imaging, diffraction, spectroscopy, and their combinations. It has demonstrated its capability in the studies of phase transitions, mechanical vibrations, and chemical reactions. Moreover, electrons can directly interact with photons via the near field component of light scattering by nanostructures, and either gain or lose light quanta discretely in energy. By energetically selecting those electrons that exchanged photon energies, we can map this photon-electron interaction, and the technique is termed photon-induced near field electron microscopy (PINEM). Here, we give an account of the theoretical understanding of PINEM. Experimentally, nanostructures such as a sphere, cylinder, strip, and triangle have been investigated. Theoretically, time-dependent Schrodinger and Dirac equations for an electron under light are directly solved to obtain analytical solutions. The interaction probability is expressed by the mechanical work done by an optical wave on a traveling electron, which can be evaluated analytically by the near field components of the Rayleigh scattering for small spheres and thin cylinders, and numerically by the discrete dipole approximation for other geometries. Application in visualization of plasmon fields is discussed.
Additional Information
© 2013 SPIE. This work was supported by the National Science Foundation and the Air Force Office of Scientific Research in the Center for Physical Biology funded by the Gordon and Betty Moore Foundation.Attached Files
Published - Park_2013p884506.pdf
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Additional details
- Eprint ID
- 42870
- Resolver ID
- CaltechAUTHORS:20131205-152254995
- NSF
- Air Force Office of Scientific Research (AFOSR)
- Gordon and Betty Moore Foundation
- Created
-
2013-12-05Created from EPrint's datestamp field
- Updated
-
2021-11-10Created from EPrint's last_modified field
- Series Name
- Proceedings of SPIE
- Series Volume or Issue Number
- 8845