Published January 1, 1999
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Journal Article
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Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser
Abstract
Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented.
Additional Information
©1999 American Institute of Physics. Presented on 9 June 1998 The authors acknowledge the technical support of the Nova Operations and Target Fabrication groups. This work was performed under the auspices of the U.S. DOE by LLNL under Contract No. W-7405-ENG-48, and through the Materials Research Institute, LLNL, and the DOE Grants and University Use of Nova Programs.Files
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Identifiers
- Eprint ID
- 3489
- Resolver ID
- CaltechAUTHORS:KALrsi99
Related works
- Describes
- http://dx.doi.org/0.1063/1.1149384 (URL)
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2006-06-08Created from EPrint's datestamp field
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2020-03-09Created from EPrint's last_modified field