Back-action-evading measurements of nanomechanical motion
Abstract
When carrying out ultrasensitive continuous measurements of position, one must ultimately confront the fundamental effects of detection back-action. Back-action forces set a lower bound on the uncertainty in the measured position, the 'standard quantum limit' (SQL). Recent measurements of nano- and micromechanical resonators are rapidly approaching this limit. Making measurements with sensitivities surpassing the SQL will require a new kind of approach: back-action-evading (BAE), quantum non-demolition measurement techniques. Here we realize a BAE measurement based on the parametric coupling between a nanomechanical and a microwave resonator. We demonstrate for the first time BAE detection of a single quadrature of motion with sensitivity four times the quantum zero-point motion of the mechanical resonator. We identify a limiting parametric instability inherent in BAE measurement, and describe how to improve the technique to surpass the SQL and permit the formation of squeezed states of motion.
Additional Information
© 2010 Macmillan Publishers Limited. Received 24 April 2009; accepted 10 November 2009; published online 6 December 2009. We would like to acknowledge helpful conversations with G. Milburn, M. Aspelmeyer, B. Plourde, M. Blencowe and R. Onofrio, and the assistance of P. Hauck, M. Corbett, S. Rosenthal and C. Macklin. The work has been supported by Cornell University and grants from FQXi and the National Science Foundation. A.A.C. wishes to thank the Canadian Institute for Advanced Research. Device fabrication was carried out at the NSF-sponsored Cornell Nanoscale Facility.Attached Files
Submitted - 0906.0967.pdf
Supplemental Material - nphys1479-s1.pdf
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Additional details
- Eprint ID
- 17893
- Resolver ID
- CaltechAUTHORS:20100408-094321850
- Cornell University
- Foundational Questions Institute (FQXI)
- NSF
- Canadian Institute for Advanced Research (CIFAR)
- Created
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2010-05-14Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field