A radiation-tolerant, low-power non-volatile memory based on silicon nanocrystal quantum dots
Abstract
Nanocrystal nonvolatile floating-gate memories are a good candidate for space applications - initial results suggest they are fast, more reliable and consume less power than conventional floating gate memories. In the nanocrystal based NVM device, charge is not stored on a continuous polysilicon layer (so-called floating gate), but instead on a layer of discrete nanocrystals. Charge injection and storage in dense arrays of silicon nanocrystals in SiO_2 is a critical aspect of the performance of potential nanocrystal flash memory structures. The ultimate goal for this class of devices is few- or single-electron storage in a small number of nanocrystal elements. In addition, the nanocrystal layer fabrication technique should be simple, 8-inch wafer compatible and well controlled.
Additional Information
© 2001. Issue Date: Feb. 21, 2001.Attached Files
Accepted Version - BELfiaope01.pdf
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Additional details
- Eprint ID
- 27752
- Resolver ID
- CaltechAUTHORS:20111111-112553643
- Created
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2011-12-06Created from EPrint's datestamp field
- Updated
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2019-10-03Created from EPrint's last_modified field
- Other Numbering System Name
- JPL Technical Reports
- Other Numbering System Identifier
- JPL-TR-01-0229