Published May 3, 1982
| Published
Journal Article
Open
Direct measurement of desorption kinetics of ^4He at low temperatures
- Creators
- Sinvani, M.
- Taborek, P.
- Goodstein, D.
Abstract
A direct method for measuring the desorption time constant of flash-desorbed 4He films (≲ 1 monolayer), adsorbed on Nichrome or Constantan heaters, is described. A time constant τ is found which behaves as τ=τ0exp[E/Ts], where Ts is the heater temperature. The value for the characteristic lifetime τ0 is 10^-9 -10^-10 sec, orders of magnitude shorter than that previously reported. The measured energy parameter E was found to be ~ 2/3 of the chemical potential.
Additional Information
© 1982 by The American Physical Society. Received 27 January 1982. We wish to thank Professor Milton W. Cole and Michael Weimer for substantial contributions, and Roman Movshovich for technical help. This work was supported by U.S. Office of Naval Research Contract No. N0014-80-C-0447. One of us (M.S.) wishes to acknowledge the support of a Bantrell Fellowship.Attached Files
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Additional details
- Alternative title
- Direct measurement of desorption kinetics of 4He at low temperatures
- Eprint ID
- 11645
- Resolver ID
- CaltechAUTHORS:SINprl82
- Office of Naval Research (ONR)
- N0014-80-C-0447
- Bantrell Foundation
- Created
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2008-09-17Created from EPrint's datestamp field
- Updated
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2021-11-08Created from EPrint's last_modified field