Published November 7, 2012
| public
Journal Article
Thermally Induced Parametric Instability in a Back-Action Evading Measurement of a Micromechanical Quadrature near the Zero-Point Level
Abstract
We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.
Additional Information
© 2012 American Chemical Society. Received: September 7, 2012; Revised: October 30, 2012; Published: November 7, 2012. We would like to acknowledge generous and essential support from DARPA (DARPA-QUANTUM HR0011-10-1-0066) and the National Science Foundation (NSF-DMR 1052647, NSF-IQIM 1125565). Fabrication was performed at the Microdevice Laboratory at JPL, and the Kavli Nanoscience Institute at Caltech.Additional details
- Eprint ID
- 36244
- DOI
- 10.1021/nl303353r
- Resolver ID
- CaltechAUTHORS:20130108-140901859
- Defense Advanced Research Projects Agency (DARPA)
- HR0011-10-1-0066
- NSF
- DMR-1052647
- NSF
- PHY-1125565
- Created
-
2013-01-08Created from EPrint's datestamp field
- Updated
-
2021-11-09Created from EPrint's last_modified field
- Caltech groups
- Institute for Quantum Information and Matter, Kavli Nanoscience Institute