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Published November 7, 2012 | public
Journal Article

Thermally Induced Parametric Instability in a Back-Action Evading Measurement of a Micromechanical Quadrature near the Zero-Point Level


We report the results of back-action evading experiments utilizing a tightly coupled electro-mechanical system formed by a radio frequency micromechanical resonator parametrically coupled to a NbTiN superconducting microwave resonator. Due to excess dissipation in the microwave resonator, we observe a parametric instability induced by a thermal shift of the mechanical resonance frequency. In light of these measurements, we discuss the constraints on microwave dissipation needed to perform BAE measurements far below the zero-point level.

Additional Information

© 2012 American Chemical Society. Received: September 7, 2012; Revised: October 30, 2012; Published: November 7, 2012. We would like to acknowledge generous and essential support from DARPA (DARPA-QUANTUM HR0011-10-1-0066) and the National Science Foundation (NSF-DMR 1052647, NSF-IQIM 1125565). Fabrication was performed at the Microdevice Laboratory at JPL, and the Kavli Nanoscience Institute at Caltech.

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