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Published March 6, 2006 | Published
Journal Article Open

Characterization of domain walls in BaTiO3 using simultaneous atomic force and piezo response force microscopy


In this letter a method to simultaneously measure the physical and the polarization thickness of a 90° domain wall in a ferroelectric perovskite is presented. This method combines accurate atomic force microscopy and piezoresponse force microscopy scans of the same area with little drift and an analysis of the entire scanned area. It is found that the physical thickness is significantly narrower (about seven and a half times) than the polarization thickness in a 90° domain wall in BaTiO3. Evidence of the trapping of defects at such domain walls is also found.

Additional Information

©2006 American Institute of Physics (Received 3 November 2005; accepted 31 January 2006; published online 10 March 2006) The authors gratefully acknowledge the financial support of the U.S. Army Research Office (DAAD-19-01-1-0517). They thank Dr. D. Shilo for his help with the experimental investigation.

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