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Published December 2010 | Supplemental Material
Journal Article Open

Efficient Coupling between Dielectric-Loaded Plasmonic and Silicon Photonic Waveguides


The realization of practical on-chip plasmonic devices will require efficient coupling of light into and out of surface plasmon waveguides over short length scales. In this letter, we report on low insertion loss for polymer-on-gold dielectric-loaded plasmonic waveguides end-coupled to silicon-on-insulator waveguides with a coupling efficiency of 79 ± 2% per transition at telecommunication wavelengths. Propagation loss is determined independently of insertion loss by measuring the transmission through plasmonic waveguides of varying length, and we find a characteristic surface-plasmon propagation length of 51 ± 4 μm at a free-space wavelength of λ = 1550 nm. We also demonstrate efficient coupling to whispering-gallery modes in plasmonic ring resonators with an average bending-loss-limited quality factor of 180 ± 8.

Additional Information

© 2010 American Chemical Society. Received for review: 07/14/2010. Published on Web: 10/28/2010. This work was supported by the Air Force Office of Scientific Research under MURI Award FA9550-06-1-0470 and Grant FA9550-09-1-0673. The authors gratefully acknowledge critical support and infrastructure provided by the Kavli Nanoscience Institute at Caltech. R.M.B. appreciatively acknowledges support from the National Defense Science and Engineering Graduate Fellowship and also thanks K. Aydin, D. Chi, and A. Yariv for helpful discussions.

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Supplemental Material - nl1024529_si_001.pdf


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