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Published July 29, 2013 | Published
Journal Article Open

Optomechanical effects of two-level systems in a back-action evading measurement of micro-mechanical motion


We show that the two-level systems (TLS) in lithographic superconducting circuits act as a power-dependent dielectric leading to non-linear responses in a parametrically coupled electromechanical system. Driven TLS shift the microwave resonance frequency and modulate the mechanical resonance through the optical spring effect. By pumping with two tones in a back-action evading measurement, these effects produce a mechanical parametric instability which limits single quadrature imprecision to 1.4 x_(zp). The microwave resonator noise is also consistent to a TLS-noise model. These observations suggest design strategies for minimizing TLS effects to improve ground-state cooling and quantum non-demolition measurements of motion.

Additional Information

© 2013 AIP Publishing LLC. Received 29 April 2013; accepted 3 July 2013; published online 29 July 2013. We acknowledge funding provided by the Institute for Quantum Information and Matter, an NSF Physics Frontiers Center with support of the Gordon and Betty Moore Foundation (NSF-IQIM 1125565), by DARPA (DARPA-QUANTUM HR0011-10-1-0066), and by NSF (NSF-DMR-1052647 and NSF-EEC 0832819).

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Published - ApplPhysLett_103_052604.pdf


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