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Published September 15, 2001 | Published
Journal Article Open

Models for quantitative charge imaging by atomic force microscopy


Two models are presented for quantitative charge imaging with an atomic-force microscope. The first is appropriate for noncontact mode and the second for intermittent contact (tapping) mode imaging. Different forms for the contact force are used to demonstrate that quantitative charge imaging is possible without precise knowledge of the contact interaction. From the models, estimates of the best charge sensitivity of an unbiased standard atomic-force microscope cantilever are found to be on the order of a few electrons.

Additional Information

© 2001 American Institute of Physics. (Received 27 February 2001; accepted 24 June 2001) The research described in this article was jointly sponsored by the National Aeronautics and Space Administration (NASA) and the Jet Propulsion Laboratory Director's Research and Development Fund, and by the National Science Foundation under Grant No. DMR98-71850.

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