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Published April 1993 | Published
Journal Article Open

Scanned-cantilever atomic force microscope


We have developed a 3.6 µm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilever. The performance of the microscope matches that of scanned-sample instruments.

Additional Information

Copyright © 1993 American Institute of Physics. Received 28 September 1992; accepted 11 December 1992. We would like to thank Jean-Paul Revel for suggesting that we image collagen fibrils and for help preparing collagen samples. We would also like to thank Shubert Soares for the polished quartz samples and Topometrix, Inc. for the use of their electronics. This work was supported in part by a grant from the Ford Motor Company and an NSF predoctoral fellowship (D.B.). David R. Baselt and John D. Baldeschwieler (1994) Comment on "Scanned-cantilever atomic force microscope" [Rev. Sci. Instrum. 64, 908 (1993)]. Rev. Sci. Instrum. 65, 2160 (1994). DOI:10.1063/1.1144721

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