Published January 12, 2011
| Supplemental Material
Journal Article
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On-Chip Rayleigh Imaging and Spectroscopy of Carbon Nanotubes
Abstract
We report a novel on-chip Rayleigh imaging technique using wide-field laser illumination to measure optical scattering from individual single-walled carbon nanotubes (SWNTs) on a solid substrate with high spatial and spectral resolution. This method in conjunction with calibrated AFM measurements accurately measures the resonance energies and diameters for a large number of SWNTs in parallel. We apply this technique for fast mapping of key SWNT parameters, including the electronic-types and chiral indices for individual SWNTs, position and frequency of chirality-changing events, and intertube interactions in both bundled and distant SWNTs.
Additional Information
© 2010 American Chemical Society. Received for review: 04/9/2010. Published on Web: 08/02/2010. We thank P. L. McEuen for useful discussions. The authors also thank Y. J. Kim for assistance with sample fabrication. This work was supported by the NSF through the Center for Nanoscale Systems, Cornell Center for Materials Research, Center for Chemical Innovation, and NSF CAREER grant. Additional funding was received from the DoD through AFOSR DURIP. Sample fabrication was performed at the Cornell Nanoscale Science and Technology Facility, a National Nanotechnology Infrastructure Network node.Attached Files
Supplemental Material - nl1012568_si_001.pdf
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Additional details
- Eprint ID
- 73570
- Resolver ID
- CaltechAUTHORS:20170120-100413294
- NSF
- Air Force Office of Scientific Research (AFOSR)
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2017-01-22Created from EPrint's datestamp field
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2021-11-11Created from EPrint's last_modified field