Learning the effective adhesive properties of heterogeneous substrates
Abstract
Adhesion is a fundamental phenomenon that plays a role in many engineering and biological applications. This paper concerns the use of machine learning to characterize the effective adhesive properties when a thin film is peeled from a heterogeneous substrate. There has been recent interest in the use of machine learning in multiscale modeling where macroscale constitutive relations are learnt from data gathered from repeated solution of the microscale problem. We extend this approach to peeling; this is challenging because peeling from heterogeneous substrates is characterized by pinning where the peel front gets stuck at a heterogeneity followed by an abrupt depinning. This results in a heterogeneity dependent critical force and a singular peel force vs. overall peel rate relationship. We propose a neural architecture that is able to accurately predict both the critical peel force and the singular nature of the peel force vs. overall peel rate relationship from the heterogeneous adhesive pattern. Similar issues arise in other free boundary and free discontinuity problems, and the methods we develop are applicable in those contexts.
Copyright and License
© 2023 Elsevier Ltd. All rights reserved.
Acknowledgement
We are delighted to acknowledge helpful discussions with Professor Jean-François Molinari. We gratefully acknowledge the financial support of the Army Research Office, United States through grant number W911NF-22-1-0269. The simulations reported here were conducted on the Resnick High Performance Computing Cluster at the California Institute of Technology.
Funding
We gratefully acknowledge the financial support of the Army Research Office, United States through grant number W911NF-22-1-0269.
Data Availability
Data will be made available on request.
Additional details
- United States Army Research Office
- W911NF-22-1-0269
- Accepted
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2023-11-21Accepted
- Available
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2023-11-25Available online
- Available
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2023-11-28Version of record
- Publication Status
- Published